Microscopy, Electron, Scanning
| Definition: |
Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point, giving the surface image a three-dimensional quality. |
| Notes: |
NIM; do not confuse with MICROSCOPY, ELECTRON, SCANNING TRANSMISSION or STEM; if in doubt, follow words of author; MICROSCOPY, SCANNING TUNNELING is also available |
| Previously Indexed: |
Microscopy, Electron (1966-1968) |
Microscopy, Electron, Scanning Categories.
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Microscopy, Electron, Scanning Transmission - A type of electron microscopy which scans with an extremely narrow beam that is transmitted through the sample. The detection apparatus produces an image whose brightness depends on the atomic number of the sample. It should not be confused with MICROSCOPY, ELECTRON SCANNING nor with MICROSCOPY, ELECTRON, TRANSMISSION (see MICROSCOPY, ELECTRON). (McGraw-Hill Dictionary of Scientific and Technical Terms, 3d ed) |
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Microscopy, Scanning Probe - Electron microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING). |
Microscopy, Electron, Scanning Definitions and Terms
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